Domínguez, J., Mass, J., Moralejo, B., Martínez, O., Jiménez, J., Ardila, A. M., Parra, V. (2012) Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC. Journal of Materials Science, 47. 5470-5476 doi:10.1007/s10853-012-6437-8
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC | ||
Journal | Journal of Materials Science | ||
Authors | Domínguez, J. | Author | |
Mass, J. | Author | ||
Moralejo, B. | Author | ||
Martínez, O. | Author | ||
Jiménez, J. | Author | ||
Ardila, A. M. | Author | ||
Parra, V. | Author | ||
Year | 2012 (July) | Volume | 47 |
Publisher | Springer Science and Business Media LLC | ||
DOI | doi:10.1007/s10853-012-6437-8Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 10010455 | Long-form Identifier | mindat:1:5:10010455:8 |
GUID | 0 | ||
Full Reference | Domínguez, J., Mass, J., Moralejo, B., Martínez, O., Jiménez, J., Ardila, A. M., Parra, V. (2012) Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC. Journal of Materials Science, 47. 5470-5476 doi:10.1007/s10853-012-6437-8 | ||
Plain Text | Domínguez, J., Mass, J., Moralejo, B., Martínez, O., Jiménez, J., Ardila, A. M., Parra, V. (2012) Influence of different surface treatments on multicrystalline silicon wafers for defect characterization by LBIC. Journal of Materials Science, 47. 5470-5476 doi:10.1007/s10853-012-6437-8 | ||
In | (n.d.) Journal of Materials Science Vol. 47. Springer Science and Business Media LLC |
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