Reference Type | Journal (article/letter/editorial) |
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Title | Effect of strain rate on the dislocation cell size at various stress levels during uniaxial tensile testing of electrical conductor aluminum |
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Journal | Materials Science and Engineering: A |
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Authors | Chao, Yi-Yin | Author |
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Varma, S.K. | Author |
Year | 1991 (January) | Volume | 131 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0921-5093(91)90409-gSearch in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 10020245 | Long-form Identifier | mindat:1:5:10020245:2 |
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GUID | 0 |
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Full Reference | Chao, Yi-Yin, Varma, S.K. (1991) Effect of strain rate on the dislocation cell size at various stress levels during uniaxial tensile testing of electrical conductor aluminum. Materials Science and Engineering: A, 131. doi:10.1016/0921-5093(91)90409-g |
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Plain Text | Chao, Yi-Yin, Varma, S.K. (1991) Effect of strain rate on the dislocation cell size at various stress levels during uniaxial tensile testing of electrical conductor aluminum. Materials Science and Engineering: A, 131. doi:10.1016/0921-5093(91)90409-g |
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In | (n.d.) Materials Science and Engineering: A Vol. 131. Elsevier BV |
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