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Yoshimi, K., Yoo, M.H., Wereszczak, A.A., Borowicz, S.M., George, E.P., Miura, E., Hanada, S. (2002) Deformation behavior of Mo5Si3 single crystal at high temperatures. Materials Science and Engineering: A, 329. 228-234 doi:10.1016/s0921-5093(01)01578-7

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Reference TypeJournal (article/letter/editorial)
TitleDeformation behavior of Mo5Si3 single crystal at high temperatures
JournalMaterials Science and Engineering: A
AuthorsYoshimi, K.Author
Yoo, M.H.Author
Wereszczak, A.A.Author
Borowicz, S.M.Author
George, E.P.Author
Miura, E.Author
Hanada, S.Author
Year2002 (June)Volume329
PublisherElsevier BV
DOIdoi:10.1016/s0921-5093(01)01578-7Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10029198Long-form Identifiermindat:1:5:10029198:2
GUID0
Full ReferenceYoshimi, K., Yoo, M.H., Wereszczak, A.A., Borowicz, S.M., George, E.P., Miura, E., Hanada, S. (2002) Deformation behavior of Mo5Si3 single crystal at high temperatures. Materials Science and Engineering: A, 329. 228-234 doi:10.1016/s0921-5093(01)01578-7
Plain TextYoshimi, K., Yoo, M.H., Wereszczak, A.A., Borowicz, S.M., George, E.P., Miura, E., Hanada, S. (2002) Deformation behavior of Mo5Si3 single crystal at high temperatures. Materials Science and Engineering: A, 329. 228-234 doi:10.1016/s0921-5093(01)01578-7
In(n.d.) Materials Science and Engineering: A Vol. 329. Elsevier BV

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