Reference Type | Journal (article/letter/editorial) |
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Title | Creep of lamellar TiAl alloys: degradation, stabilization and design of lamellar boundaries |
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Journal | Materials Science and Engineering: A |
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Authors | Maruyama, Kouichi | Author |
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Kim, Hee Y. | Author |
Zhu, Hanliang | Author |
Year | 2004 (December) | Volume | 387 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/j.msea.2004.01.124Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 10032169 | Long-form Identifier | mindat:1:5:10032169:6 |
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GUID | 0 |
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Full Reference | Maruyama, Kouichi, Kim, Hee Y., Zhu, Hanliang (2004) Creep of lamellar TiAl alloys: degradation, stabilization and design of lamellar boundaries. Materials Science and Engineering: A, 387. 910-917 doi:10.1016/j.msea.2004.01.124 |
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Plain Text | Maruyama, Kouichi, Kim, Hee Y., Zhu, Hanliang (2004) Creep of lamellar TiAl alloys: degradation, stabilization and design of lamellar boundaries. Materials Science and Engineering: A, 387. 910-917 doi:10.1016/j.msea.2004.01.124 |
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In | (n.d.) Materials Science and Engineering: A Vol. 387. Elsevier BV |
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