Kwon, E.P., Sato, S., Fujieda, S., Shinoda, K., Kajiwara, K., Sato, M., Suzuki, S. (2013) Microscopic residual stress evolution during deformation process of an FeMnSiCr shape memory alloy investigated using white X-ray microbeam diffraction. Materials Science and Engineering: A, 570. 43-50 doi:10.1016/j.msea.2013.01.064
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Microscopic residual stress evolution during deformation process of an FeMnSiCr shape memory alloy investigated using white X-ray microbeam diffraction | ||
| Journal | Materials Science and Engineering: A | ||
| Authors | Kwon, E.P. | Author | |
| Sato, S. | Author | ||
| Fujieda, S. | Author | ||
| Shinoda, K. | Author | ||
| Kajiwara, K. | Author | ||
| Sato, M. | Author | ||
| Suzuki, S. | Author | ||
| Year | 2013 (May) | Volume | 570 |
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.msea.2013.01.064Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 10044218 | Long-form Identifier | mindat:1:5:10044218:6 |
| GUID | 0 | ||
| Full Reference | Kwon, E.P., Sato, S., Fujieda, S., Shinoda, K., Kajiwara, K., Sato, M., Suzuki, S. (2013) Microscopic residual stress evolution during deformation process of an FeMnSiCr shape memory alloy investigated using white X-ray microbeam diffraction. Materials Science and Engineering: A, 570. 43-50 doi:10.1016/j.msea.2013.01.064 | ||
| Plain Text | Kwon, E.P., Sato, S., Fujieda, S., Shinoda, K., Kajiwara, K., Sato, M., Suzuki, S. (2013) Microscopic residual stress evolution during deformation process of an FeMnSiCr shape memory alloy investigated using white X-ray microbeam diffraction. Materials Science and Engineering: A, 570. 43-50 doi:10.1016/j.msea.2013.01.064 | ||
| In | (n.d.) Materials Science and Engineering: A Vol. 570. Elsevier BV | ||
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