Hou, J.P., Chen, Q.Y., Wang, Q., Yu, H.Y., Zhang, Z.J., Li, R., Li, X.W., Zhang, Z.F. (2017) Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor. Materials Science and Engineering: A, 707. 511-517 doi:10.1016/j.msea.2017.09.075
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor | ||
| Journal | Materials Science and Engineering: A | ||
| Authors | Hou, J.P. | Author | |
| Chen, Q.Y. | Author | ||
| Wang, Q. | Author | ||
| Yu, H.Y. | Author | ||
| Zhang, Z.J. | Author | ||
| Li, R. | Author | ||
| Li, X.W. | Author | ||
| Zhang, Z.F. | Author | ||
| Year | 2017 (November) | Volume | 707 |
| Publisher | Elsevier BV | ||
| DOI | doi:10.1016/j.msea.2017.09.075Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 10050704 | Long-form Identifier | mindat:1:5:10050704:5 |
| GUID | 0 | ||
| Full Reference | Hou, J.P., Chen, Q.Y., Wang, Q., Yu, H.Y., Zhang, Z.J., Li, R., Li, X.W., Zhang, Z.F. (2017) Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor. Materials Science and Engineering: A, 707. 511-517 doi:10.1016/j.msea.2017.09.075 | ||
| Plain Text | Hou, J.P., Chen, Q.Y., Wang, Q., Yu, H.Y., Zhang, Z.J., Li, R., Li, X.W., Zhang, Z.F. (2017) Effects of annealing treatment on the microstructure evolution and the strength degradation behavior of the commercially pure Al conductor. Materials Science and Engineering: A, 707. 511-517 doi:10.1016/j.msea.2017.09.075 | ||
| In | (n.d.) Materials Science and Engineering: A Vol. 707. Elsevier BV | ||
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