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Sauret, Elie Serge Gaëtan, Beaujean, Jean, Nguyen, Frederic, Wildemeersch, Samuel, Brouyere, Serge (2015) Characterization of superficial deposits using electrical resistivity tomography (ERT) and horizontal-to-vertical spectral ratio (HVSR) geophysical methods: A case study. Journal of Applied Geophysics, 121. 140-148 doi:10.1016/j.jappgeo.2015.07.012

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Reference TypeJournal (article/letter/editorial)
TitleCharacterization of superficial deposits using electrical resistivity tomography (ERT) and horizontal-to-vertical spectral ratio (HVSR) geophysical methods: A case study
JournalJournal of Applied Geophysics
AuthorsSauret, Elie Serge GaëtanAuthor
Beaujean, JeanAuthor
Nguyen, FredericAuthor
Wildemeersch, SamuelAuthor
Brouyere, SergeAuthor
Year2015 (October)Volume121
PublisherElsevier BV
DOIdoi:10.1016/j.jappgeo.2015.07.012Search in ResearchGate
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Mindat Ref. ID1010487Long-form Identifiermindat:1:5:1010487:7
GUID0
Full ReferenceSauret, Elie Serge Gaëtan, Beaujean, Jean, Nguyen, Frederic, Wildemeersch, Samuel, Brouyere, Serge (2015) Characterization of superficial deposits using electrical resistivity tomography (ERT) and horizontal-to-vertical spectral ratio (HVSR) geophysical methods: A case study. Journal of Applied Geophysics, 121. 140-148 doi:10.1016/j.jappgeo.2015.07.012
Plain TextSauret, Elie Serge Gaëtan, Beaujean, Jean, Nguyen, Frederic, Wildemeersch, Samuel, Brouyere, Serge (2015) Characterization of superficial deposits using electrical resistivity tomography (ERT) and horizontal-to-vertical spectral ratio (HVSR) geophysical methods: A case study. Journal of Applied Geophysics, 121. 140-148 doi:10.1016/j.jappgeo.2015.07.012
In(2015) Journal of Applied Geophysics Vol. 121. Elsevier BV

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