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KORNILOV, V. M., LACHINOV, A. N. (1993) Electron-microscopic analysis of polymer switching thin films. Le Journal de Physique IV, 3. doi:10.1051/jp4:19937249

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Reference TypeJournal (article/letter/editorial)
TitleElectron-microscopic analysis of polymer switching thin films
JournalLe Journal de Physique IV
AuthorsKORNILOV, V. M.Author
LACHINOV, A. N.Author
Year1993 (November)Volume3
PublisherEDP Sciences
DOIdoi:10.1051/jp4:19937249Search in ResearchGate
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Mindat Ref. ID10296444Long-form Identifiermindat:1:5:10296444:0
GUID0
Full ReferenceKORNILOV, V. M., LACHINOV, A. N. (1993) Electron-microscopic analysis of polymer switching thin films. Le Journal de Physique IV, 3. doi:10.1051/jp4:19937249
Plain TextKORNILOV, V. M., LACHINOV, A. N. (1993) Electron-microscopic analysis of polymer switching thin films. Le Journal de Physique IV, 3. doi:10.1051/jp4:19937249
In(n.d.) Le Journal de Physique IV Vol. 3. EDP Sciences

See Also

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LACHINOV, A. N., ZHEREBOV, A. Yu., KORNILOV, V. M., ZOLOTUKHIN, M. G. (1993) New polymer materials - new prospects. Le Journal de Physique IV, 3. doi:10.1051/jp4:19937248
CHURAEVA, M. N. (1993) Ellipsometric analysis for CVD thick films on weakly absorbing substrates. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993324
Kornilov, V.M., Lachinov, A.N. (1992) Electron-microscopic analysis of polymer thin films capable of switching to the conductive state. Synthetic Metals, 53 (1). 71-76 doi:10.1016/0379-6779(92)90009-8
BROWN, L. M. (1993) Scanning transmission electron microscopy. Le Journal de Physique IV, 3. doi:10.1051/jp4:19937331
FUFLYIGIN, V. N., KAUL, A. R., POZIGUN, S. A. (1993) Effect of CVD process parameters on phase and chemical composition of BSCCO thin films. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993349
DAOUD, M. (1993) Phase and microphase separation in polymer blends. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993118
SANTISO, J., FIGUERAS, A. (1993) YBa2Cu3O7-x thin films deposition on YSZ substrates by MOCVD. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993348
CHERNS, D. (1993) Convergent beam electron diffraction. Le Journal de Physique IV, 3. doi:10.1051/jp4:19937336
GERFIN, T., BECHT, M., DAHMEN, K.-H. (1993) Growth kinetics of copper thin films in different MOCVD systems. Le Journal de Physique IV, 3. doi:10.1051/jp4:1993347
Ryazanov, M., Korsakov, I., Kuzmina, N. (1999) MOCVD of ferroelectric BaMgF4 thin films. Le Journal de Physique IV, 9. doi:10.1051/jp4:1999859
SCHULTE, K. (1993) Damage monitoring in polymer matrix structures. Le Journal de Physique IV, 3. doi:10.1051/jp4:19937255
 
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