Reference Type | Journal (article/letter/editorial) |
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Title | Empirical Study on the Burn-in Time of SDRAM Products |
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Journal | Journal of Applied Sciences |
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Authors | Yang, King-Jang | Author |
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Chen, Shun-Hsing | Author |
Pai, C-K | Author |
Year | 2011 (December 1) | Volume | 11 |
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Publisher | Science Alert |
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DOI | doi:10.3923/jas.2011.2200.2206Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 10341797 | Long-form Identifier | mindat:1:5:10341797:6 |
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GUID | 0 |
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Full Reference | Yang, King-Jang, Chen, Shun-Hsing, Pai, C-K (2011) Empirical Study on the Burn-in Time of SDRAM Products. Journal of Applied Sciences, 11. 2200-2206 doi:10.3923/jas.2011.2200.2206 |
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Plain Text | Yang, King-Jang, Chen, Shun-Hsing, Pai, C-K (2011) Empirical Study on the Burn-in Time of SDRAM Products. Journal of Applied Sciences, 11. 2200-2206 doi:10.3923/jas.2011.2200.2206 |
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In | (n.d.) Journal of Applied Sciences Vol. 11. Science Alert |
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