Yong, Chen, Yong-sheng, Cheng (2013) Research on Characteristic of Capacitor under Strong Stress. Journal of Applied Sciences, 13. 5483-5487 doi:10.3923/jas.2013.5483.5487
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Research on Characteristic of Capacitor under Strong Stress | ||
Journal | Journal of Applied Sciences | ||
Authors | Yong, Chen | Author | |
Yong-sheng, Cheng | Author | ||
Year | 2013 (December 1) | Volume | 13 |
Publisher | Science Alert | ||
DOI | doi:10.3923/jas.2013.5483.5487Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 10343300 | Long-form Identifier | mindat:1:5:10343300:6 |
GUID | 0 | ||
Full Reference | Yong, Chen, Yong-sheng, Cheng (2013) Research on Characteristic of Capacitor under Strong Stress. Journal of Applied Sciences, 13. 5483-5487 doi:10.3923/jas.2013.5483.5487 | ||
Plain Text | Yong, Chen, Yong-sheng, Cheng (2013) Research on Characteristic of Capacitor under Strong Stress. Journal of Applied Sciences, 13. 5483-5487 doi:10.3923/jas.2013.5483.5487 | ||
In | (n.d.) Journal of Applied Sciences Vol. 13. Science Alert |
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