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Wang, Quanjun, Qiu, Shunli, Xiong, Feifei, Li, Yuan, Ding, Bin, Guo, Yanling, Chen, Ximeng, Chen, Lin (2015) Charge exchange of O− scattering on a Si(111) surface. The European Physical Journal D, 69. doi:10.1140/epjd/e2015-60057-0

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Reference TypeJournal (article/letter/editorial)
TitleCharge exchange of O− scattering on a Si(111) surface
JournalThe European Physical Journal D
AuthorsWang, QuanjunAuthor
Qiu, ShunliAuthor
Xiong, FeifeiAuthor
Li, YuanAuthor
Ding, BinAuthor
Guo, YanlingAuthor
Chen, XimengAuthor
Chen, LinAuthor
Year2015 (September)Volume69
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1140/epjd/e2015-60057-0Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10361433Long-form Identifiermindat:1:5:10361433:7
GUID0
Full ReferenceWang, Quanjun, Qiu, Shunli, Xiong, Feifei, Li, Yuan, Ding, Bin, Guo, Yanling, Chen, Ximeng, Chen, Lin (2015) Charge exchange of O− scattering on a Si(111) surface. The European Physical Journal D, 69. doi:10.1140/epjd/e2015-60057-0
Plain TextWang, Quanjun, Qiu, Shunli, Xiong, Feifei, Li, Yuan, Ding, Bin, Guo, Yanling, Chen, Ximeng, Chen, Lin (2015) Charge exchange of O− scattering on a Si(111) surface. The European Physical Journal D, 69. doi:10.1140/epjd/e2015-60057-0
In(n.d.) The European Physical Journal D Vol. 69. Springer Science and Business Media LLC

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