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Lei, Yu, Cheng, Rui, Zhou, Xianming, Wang, Xing, Wang, Yuyu, Ren, Jieru, Zhao, Yongtao, Ma, Xinwen, Xiao, Guoqing (2018) Charge state effect on K-shell ionization of silicon induced by iodineq+ ions. The European Physical Journal D, 72. doi:10.1140/epjd/e2018-80772-0

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Reference TypeJournal (article/letter/editorial)
TitleCharge state effect on K-shell ionization of silicon induced by iodineq+ ions
JournalThe European Physical Journal D
AuthorsLei, YuAuthor
Cheng, RuiAuthor
Zhou, XianmingAuthor
Wang, XingAuthor
Wang, YuyuAuthor
Ren, JieruAuthor
Zhao, YongtaoAuthor
Ma, XinwenAuthor
Xiao, GuoqingAuthor
Year2018 (August)Volume72
PublisherSpringer Science and Business Media LLC
DOIdoi:10.1140/epjd/e2018-80772-0Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10362258Long-form Identifiermindat:1:5:10362258:5
GUID0
Full ReferenceLei, Yu, Cheng, Rui, Zhou, Xianming, Wang, Xing, Wang, Yuyu, Ren, Jieru, Zhao, Yongtao, Ma, Xinwen, Xiao, Guoqing (2018) Charge state effect on K-shell ionization of silicon induced by iodineq+ ions. The European Physical Journal D, 72. doi:10.1140/epjd/e2018-80772-0
Plain TextLei, Yu, Cheng, Rui, Zhou, Xianming, Wang, Xing, Wang, Yuyu, Ren, Jieru, Zhao, Yongtao, Ma, Xinwen, Xiao, Guoqing (2018) Charge state effect on K-shell ionization of silicon induced by iodineq+ ions. The European Physical Journal D, 72. doi:10.1140/epjd/e2018-80772-0
In(n.d.) The European Physical Journal D Vol. 72. Springer Science and Business Media LLC

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