Reference Type | Journal (article/letter/editorial) |
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Title | Geometric phase shift sensitivity in an area chirped array of atom interferometers |
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Journal | The European Physical Journal D |
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Authors | Toland, John R. E. | Author |
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Campo, Christian | Author |
Rivera, Tabitha | Author |
Sandoval-Sanchez, Karina | Author |
Year | 2020 (February) | Volume | 74 |
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Publisher | Springer Science and Business Media LLC |
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DOI | doi:10.1140/epjd/e2019-90436-2Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 10362590 | Long-form Identifier | mindat:1:5:10362590:6 |
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GUID | 0 |
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Full Reference | Toland, John R. E., Campo, Christian, Rivera, Tabitha, Sandoval-Sanchez, Karina (2020) Geometric phase shift sensitivity in an area chirped array of atom interferometers. The European Physical Journal D, 74. doi:10.1140/epjd/e2019-90436-2 |
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Plain Text | Toland, John R. E., Campo, Christian, Rivera, Tabitha, Sandoval-Sanchez, Karina (2020) Geometric phase shift sensitivity in an area chirped array of atom interferometers. The European Physical Journal D, 74. doi:10.1140/epjd/e2019-90436-2 |
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In | (n.d.) The European Physical Journal D Vol. 74. Springer Science and Business Media LLC |
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