Reference Type | Journal (article/letter/editorial) |
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Title | Physicochemical characterization of tin tailings slurries |
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Journal | Applied Clay Science |
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Authors | Chan, Y.K. | Author |
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Ho, C.C. | Author |
Lee, K.C. | Author |
Yeap, E.B. | Author |
Year | 1994 (June) | Volume | 9 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0169-1317(94)90028-0Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 10362955 | Long-form Identifier | mindat:1:5:10362955:3 |
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GUID | 0 |
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Full Reference | Chan, Y.K., Ho, C.C., Lee, K.C., Yeap, E.B. (1994) Physicochemical characterization of tin tailings slurries. Applied Clay Science, 9. 83-96 doi:10.1016/0169-1317(94)90028-0 |
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Plain Text | Chan, Y.K., Ho, C.C., Lee, K.C., Yeap, E.B. (1994) Physicochemical characterization of tin tailings slurries. Applied Clay Science, 9. 83-96 doi:10.1016/0169-1317(94)90028-0 |
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In | (1994) Applied Clay Science Vol. 9. Elsevier BV |
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