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Mee, S.J., Hart, J.R., Singh, M., Rowson, N.A., Greenwood, R.W., Allen, G.C., Heard, P.J., Skuse, D.R. (2008) The use of focused ion beams for the characterisation of industrial mineral microparticles. Applied Clay Science, 39. 72-77 doi:10.1016/j.clay.2007.04.010

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Reference TypeJournal (article/letter/editorial)
TitleThe use of focused ion beams for the characterisation of industrial mineral microparticles
JournalApplied Clay Science
AuthorsMee, S.J.Author
Hart, J.R.Author
Singh, M.Author
Rowson, N.A.Author
Greenwood, R.W.Author
Allen, G.C.Author
Heard, P.J.Author
Skuse, D.R.Author
Year2008 (April)Volume39
PublisherElsevier BV
DOIdoi:10.1016/j.clay.2007.04.010Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10363962Long-form Identifiermindat:1:5:10363962:0
GUID0
Full ReferenceMee, S.J., Hart, J.R., Singh, M., Rowson, N.A., Greenwood, R.W., Allen, G.C., Heard, P.J., Skuse, D.R. (2008) The use of focused ion beams for the characterisation of industrial mineral microparticles. Applied Clay Science, 39. 72-77 doi:10.1016/j.clay.2007.04.010
Plain TextMee, S.J., Hart, J.R., Singh, M., Rowson, N.A., Greenwood, R.W., Allen, G.C., Heard, P.J., Skuse, D.R. (2008) The use of focused ion beams for the characterisation of industrial mineral microparticles. Applied Clay Science, 39. 72-77 doi:10.1016/j.clay.2007.04.010
In(2008) Applied Clay Science Vol. 39. Elsevier BV

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