Jerigova, Monika, Szöcs, Vojtech, Janek, Marian, Lorenc, Dusan, Velic, Dusan (2016) Muscovite single layer resolution: Secondary ion mass spectrometry depth profile. Applied Clay Science, 132. 621-625 doi:10.1016/j.clay.2016.08.012
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Muscovite single layer resolution: Secondary ion mass spectrometry depth profile | ||
Journal | Applied Clay Science | ||
Authors | Jerigova, Monika | Author | |
Szöcs, Vojtech | Author | ||
Janek, Marian | Author | ||
Lorenc, Dusan | Author | ||
Velic, Dusan | Author | ||
Year | 2016 (November) | Volume | 132 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.clay.2016.08.012Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 10366752 | Long-form Identifier | mindat:1:5:10366752:4 |
GUID | 0 | ||
Full Reference | Jerigova, Monika, Szöcs, Vojtech, Janek, Marian, Lorenc, Dusan, Velic, Dusan (2016) Muscovite single layer resolution: Secondary ion mass spectrometry depth profile. Applied Clay Science, 132. 621-625 doi:10.1016/j.clay.2016.08.012 | ||
Plain Text | Jerigova, Monika, Szöcs, Vojtech, Janek, Marian, Lorenc, Dusan, Velic, Dusan (2016) Muscovite single layer resolution: Secondary ion mass spectrometry depth profile. Applied Clay Science, 132. 621-625 doi:10.1016/j.clay.2016.08.012 | ||
In | (2016) Applied Clay Science Vol. 132. Elsevier BV |
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