Batista, A.H., Melo, V.F., Gilkes, R. (2017) Scanning and transmission analytical electron microscopy (STEM-EDX) identifies minor minerals and the location of minor elements in the clay fraction of soils. Applied Clay Science, 135. 447-456 doi:10.1016/j.clay.2016.10.032
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Scanning and transmission analytical electron microscopy (STEM-EDX) identifies minor minerals and the location of minor elements in the clay fraction of soils | ||
Journal | Applied Clay Science | ||
Authors | Batista, A.H. | Author | |
Melo, V.F. | Author | ||
Gilkes, R. | Author | ||
Year | 2017 (January) | Volume | 135 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.clay.2016.10.032Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 10366865 | Long-form Identifier | mindat:1:5:10366865:1 |
GUID | 0 | ||
Full Reference | Batista, A.H., Melo, V.F., Gilkes, R. (2017) Scanning and transmission analytical electron microscopy (STEM-EDX) identifies minor minerals and the location of minor elements in the clay fraction of soils. Applied Clay Science, 135. 447-456 doi:10.1016/j.clay.2016.10.032 | ||
Plain Text | Batista, A.H., Melo, V.F., Gilkes, R. (2017) Scanning and transmission analytical electron microscopy (STEM-EDX) identifies minor minerals and the location of minor elements in the clay fraction of soils. Applied Clay Science, 135. 447-456 doi:10.1016/j.clay.2016.10.032 | ||
In | (2017) Applied Clay Science Vol. 135. Elsevier BV |
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