Kraevsky, Sergey V., Tournassat, Christophe, Vayer, Marylène, Warmont, Fabienne, Grangeon, Sylvain, Ngouana Wakou, Brice F., Kalinichev, Andrey G. (2020) Identification of montmorillonite particle edge orientations by atomic-force microscopy. Applied Clay Science, 186. 105442pp. doi:10.1016/j.clay.2020.105442
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Identification of montmorillonite particle edge orientations by atomic-force microscopy | ||
Journal | Applied Clay Science | ||
Authors | Kraevsky, Sergey V. | Author | |
Tournassat, Christophe | Author | ||
Vayer, Marylène | Author | ||
Warmont, Fabienne | Author | ||
Grangeon, Sylvain | Author | ||
Ngouana Wakou, Brice F. | Author | ||
Kalinichev, Andrey G. | Author | ||
Year | 2020 (March) | Volume | 186 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.clay.2020.105442Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 10368322 | Long-form Identifier | mindat:1:5:10368322:7 |
GUID | 0 | ||
Full Reference | Kraevsky, Sergey V., Tournassat, Christophe, Vayer, Marylène, Warmont, Fabienne, Grangeon, Sylvain, Ngouana Wakou, Brice F., Kalinichev, Andrey G. (2020) Identification of montmorillonite particle edge orientations by atomic-force microscopy. Applied Clay Science, 186. 105442pp. doi:10.1016/j.clay.2020.105442 | ||
Plain Text | Kraevsky, Sergey V., Tournassat, Christophe, Vayer, Marylène, Warmont, Fabienne, Grangeon, Sylvain, Ngouana Wakou, Brice F., Kalinichev, Andrey G. (2020) Identification of montmorillonite particle edge orientations by atomic-force microscopy. Applied Clay Science, 186. 105442pp. doi:10.1016/j.clay.2020.105442 | ||
In | (2020) Applied Clay Science Vol. 186. Elsevier BV |
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