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Regan, M. J., Kawamoto, E. H., Lee, S., Pershan, P. S., Maskil, N., Deutsch, M., Magnussen, O. M., Ocko, B. M., Berman, L. E. (1995) Surface Layering in Liquid Gallium: An X-Ray Reflectivity Study. Physical Review Letters, 75 (13). 2498-2501 doi:10.1103/physrevlett.75.2498

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Reference TypeJournal (article/letter/editorial)
TitleSurface Layering in Liquid Gallium: An X-Ray Reflectivity Study
JournalPhysical Review Letters
AuthorsRegan, M. J.Author
Kawamoto, E. H.Author
Lee, S.Author
Pershan, P. S.Author
Maskil, N.Author
Deutsch, M.Author
Magnussen, O. M.Author
Ocko, B. M.Author
Berman, L. E.Author
Year1995 (September 25)Volume75
Issue13
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevlett.75.2498Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10565596Long-form Identifiermindat:1:5:10565596:3
GUID0
Full ReferenceRegan, M. J., Kawamoto, E. H., Lee, S., Pershan, P. S., Maskil, N., Deutsch, M., Magnussen, O. M., Ocko, B. M., Berman, L. E. (1995) Surface Layering in Liquid Gallium: An X-Ray Reflectivity Study. Physical Review Letters, 75 (13). 2498-2501 doi:10.1103/physrevlett.75.2498
Plain TextRegan, M. J., Kawamoto, E. H., Lee, S., Pershan, P. S., Maskil, N., Deutsch, M., Magnussen, O. M., Ocko, B. M., Berman, L. E. (1995) Surface Layering in Liquid Gallium: An X-Ray Reflectivity Study. Physical Review Letters, 75 (13). 2498-2501 doi:10.1103/physrevlett.75.2498
In(1995, September) Physical Review Letters Vol. 75 (13) American Physical Society (APS)


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