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Ahn, H., Wu, C.-L., Gwo, S., Wei, C. M., Chou, Y. C. (2001) Structure Determination of theSi3N4/Si(111)-(8×8)Surface: A Combined Study of Kikuchi Electron Holography, Scanning Tunneling Microscopy, andab initioCalculations. Physical Review Letters, 86 (13). 2818-2821 doi:10.1103/physrevlett.86.2818

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Reference TypeJournal (article/letter/editorial)
TitleStructure Determination of theSi3N4/Si(111)-(8×8)Surface: A Combined Study of Kikuchi Electron Holography, Scanning Tunneling Microscopy, andab initioCalculations
JournalPhysical Review Letters
AuthorsAhn, H.Author
Wu, C.-L.Author
Gwo, S.Author
Wei, C. M.Author
Chou, Y. C.Author
Year2001 (March 26)Volume86
Issue13
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevlett.86.2818Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID10582034Long-form Identifiermindat:1:5:10582034:7
GUID0
Full ReferenceAhn, H., Wu, C.-L., Gwo, S., Wei, C. M., Chou, Y. C. (2001) Structure Determination of theSi3N4/Si(111)-(8×8)Surface: A Combined Study of Kikuchi Electron Holography, Scanning Tunneling Microscopy, andab initioCalculations. Physical Review Letters, 86 (13). 2818-2821 doi:10.1103/physrevlett.86.2818
Plain TextAhn, H., Wu, C.-L., Gwo, S., Wei, C. M., Chou, Y. C. (2001) Structure Determination of theSi3N4/Si(111)-(8×8)Surface: A Combined Study of Kikuchi Electron Holography, Scanning Tunneling Microscopy, andab initioCalculations. Physical Review Letters, 86 (13). 2818-2821 doi:10.1103/physrevlett.86.2818
In(2001, March) Physical Review Letters Vol. 86 (13) American Physical Society (APS)

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CHANG, C. Y., SHEN, T. S., CHOU, Y. C., WEI, C. M. (1999) DIRECT OBSERVATIONS OF THE SURFACE ATOMIC STRUCTURE OF THE Si(111)-(7 × 7) RECONSTRUCTED SURFACE WITH KIKUCHI ELECTRON HOLOGRAPHY. Surface Review and Letters, 6 (6). 967-976 doi:10.1142/s0218625x99001049
Hong, I. H., Shyu, S. C., Chou, Y. C., Wei, C. M. (1996) Erratum: Surface-dimer and bulk-atom imaging of the Si(001) (2×1) surface by Kikuchi electron holography. Physical Review B, 54 (7) 5178 doi:10.1103/physrevb.54.5178
Hong, I. H., Shyu, S. C., Chou, Y. C., Wei, C. M. (1995) Surface-dimer and bulk-atom imaging of the Si(001) (2×1) surface by Kikuchi electron holography. Physical Review B, 52 (23) 16884-16891 doi:10.1103/physrevb.52.16884
Wu, C.-L., Hsieh, J.-L., Hsueh, H.-D., Gwo, S. (2002) Thermal nitridation of the Si(111)-(7×7) surface studied by scanning tunneling microscopy and spectroscopy. Physical Review B, 65 (4) doi:10.1103/physrevb.65.045309
Chang, C. Y., Chou, Y. C., Wei, C. M. (1999) Atomic structures and phase transitions of Si(113) reconstructed surfaces: Kikuchi electron holography studies. Physical Review B, 59 (16) doi:10.1103/physrevb.59.r10453
Ahn, H., Shen, C.-H., Wu, C. -L., Gwo, S. (2005) Spectroscopic ellipsometry study of wurtzite InN epitaxial films on Si(111) with varied carrier concentrations. Applied Physics Letters, 86 (20). 201905pp. doi:10.1063/1.1929097
Bernard, R., Borensztein, Y., Cruguel, H., Lazzeri, M., Prévot, G. (2015) Growth mechanism of silicene onAg(111)determined by scanning tunneling microscopy measurements andab initiocalculations. Physical Review B, 92 (4) doi:10.1103/physrevb.92.045415
Wu, H. C., Tsai, C.-S., Chou, L.-W., Lee, Y.-R., Jiang, J. C., Su, C., Lin, J.-C. (2007) A Scanning Tunneling Microscopy Study of Distyrylbenzene on Ag/Ge(111)-( × )R30°. Langmuir, 23. 12521-12528 doi:10.1021/la701845p
Upton, M. H., Wei, C. M., Chou, M. Y., Miller, T., Chiang, T.-C. (2004) Thermal Stability and Electronic Structure of Atomically Uniform Pb Films on Si(111). Physical Review Letters, 93 (2). doi:10.1103/physrevlett.93.026802
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