Miao, Jianwei, Ishikawa, Tetsuya, Johnson, Bart, Anderson, Erik H., Lai, Barry, Hodgson, Keith O. (2002) High Resolution 3D X-Ray Diffraction Microscopy. Physical Review Letters, 89 (8). doi:10.1103/physrevlett.89.088303
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | High Resolution 3D X-Ray Diffraction Microscopy | ||
| Journal | Physical Review Letters | ||
| Authors | Miao, Jianwei | Author | |
| Ishikawa, Tetsuya | Author | ||
| Johnson, Bart | Author | ||
| Anderson, Erik H. | Author | ||
| Lai, Barry | Author | ||
| Hodgson, Keith O. | Author | ||
| Year | 2002 (August 6) | Volume | 89 |
| Issue | 8 | ||
| Publisher | American Physical Society (APS) | ||
| DOI | doi:10.1103/physrevlett.89.088303Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 10588166 | Long-form Identifier | mindat:1:5:10588166:9 |
| GUID | 0 | ||
| Full Reference | Miao, Jianwei, Ishikawa, Tetsuya, Johnson, Bart, Anderson, Erik H., Lai, Barry, Hodgson, Keith O. (2002) High Resolution 3D X-Ray Diffraction Microscopy. Physical Review Letters, 89 (8). doi:10.1103/physrevlett.89.088303 | ||
| Plain Text | Miao, Jianwei, Ishikawa, Tetsuya, Johnson, Bart, Anderson, Erik H., Lai, Barry, Hodgson, Keith O. (2002) High Resolution 3D X-Ray Diffraction Microscopy. Physical Review Letters, 89 (8). doi:10.1103/physrevlett.89.088303 | ||
| In | (2002, August) Physical Review Letters Vol. 89 (8) American Physical Society (APS) | ||
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