Matsumoto, M., Fukutani, K., Okano, T. (2003) Low-Energy Electron Diffraction Study of the Phase Transition of Si(001) Surface below 40 K. Physical Review Letters, 90 (10). doi:10.1103/physrevlett.90.106103
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Low-Energy Electron Diffraction Study of the Phase Transition of Si(001) Surface below 40 K | ||
Journal | Physical Review Letters | ||
Authors | Matsumoto, M. | Author | |
Fukutani, K. | Author | ||
Okano, T. | Author | ||
Year | 2003 (March 12) | Volume | 90 |
Issue | 10 | ||
Publisher | American Physical Society (APS) | ||
DOI | doi:10.1103/physrevlett.90.106103Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 10588336 | Long-form Identifier | mindat:1:5:10588336:6 |
GUID | 0 | ||
Full Reference | Matsumoto, M., Fukutani, K., Okano, T. (2003) Low-Energy Electron Diffraction Study of the Phase Transition of Si(001) Surface below 40 K. Physical Review Letters, 90 (10). doi:10.1103/physrevlett.90.106103 | ||
Plain Text | Matsumoto, M., Fukutani, K., Okano, T. (2003) Low-Energy Electron Diffraction Study of the Phase Transition of Si(001) Surface below 40 K. Physical Review Letters, 90 (10). doi:10.1103/physrevlett.90.106103 | ||
In | (2003, March) Physical Review Letters Vol. 90 (10) American Physical Society (APS) |
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