Harvey, Steven P., Zhang, Fei, Palmstrom, Axel, Luther, Joseph M., Zhu, Kai, Berry, Joseph J. (2019) Mitigating Measurement Artifacts in TOF-SIMS Analysis of Perovskite Solar Cells. ACS Applied Materials & Interfaces, 11. 30911-30918 doi:10.1021/acsami.9b09445
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Mitigating Measurement Artifacts in TOF-SIMS Analysis of Perovskite Solar Cells | ||
Journal | ACS Applied Materials & Interfaces | ||
Authors | Harvey, Steven P. | Author | |
Zhang, Fei | Author | ||
Palmstrom, Axel | Author | ||
Luther, Joseph M. | Author | ||
Zhu, Kai | Author | ||
Berry, Joseph J. | Author | ||
Year | 2019 (August 28) | Volume | 11 |
Publisher | American Chemical Society (ACS) | ||
DOI | doi:10.1021/acsami.9b09445Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 10851921 | Long-form Identifier | mindat:1:5:10851921:7 |
GUID | 0 | ||
Full Reference | Harvey, Steven P., Zhang, Fei, Palmstrom, Axel, Luther, Joseph M., Zhu, Kai, Berry, Joseph J. (2019) Mitigating Measurement Artifacts in TOF-SIMS Analysis of Perovskite Solar Cells. ACS Applied Materials & Interfaces, 11. 30911-30918 doi:10.1021/acsami.9b09445 | ||
Plain Text | Harvey, Steven P., Zhang, Fei, Palmstrom, Axel, Luther, Joseph M., Zhu, Kai, Berry, Joseph J. (2019) Mitigating Measurement Artifacts in TOF-SIMS Analysis of Perovskite Solar Cells. ACS Applied Materials & Interfaces, 11. 30911-30918 doi:10.1021/acsami.9b09445 | ||
In | (2019) ACS Applied Materials & Interfaces Vol. 11. American Chemical Society (ACS) |
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