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Takagi, Satio, Ishida, Kohtaro, Ootuka, Akio (1978) Observation of Dislocation in a Silicon Single Crystal by X-Ray Plane Wave Topography. Journal of the Physical Society of Japan, 45 (3). 1067-1068 doi:10.1143/jpsj.45.1067

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Reference TypeJournal (article/letter/editorial)
TitleObservation of Dislocation in a Silicon Single Crystal by X-Ray Plane Wave Topography
JournalJournal of the Physical Society of Japan
AuthorsTakagi, SatioAuthor
Ishida, KohtaroAuthor
Ootuka, AkioAuthor
Year1978 (September 15)Volume45
Issue3
PublisherPhysical Society of Japan
DOIdoi:10.1143/jpsj.45.1067Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID11194311Long-form Identifiermindat:1:5:11194311:5
GUID0
Full ReferenceTakagi, Satio, Ishida, Kohtaro, Ootuka, Akio (1978) Observation of Dislocation in a Silicon Single Crystal by X-Ray Plane Wave Topography. Journal of the Physical Society of Japan, 45 (3). 1067-1068 doi:10.1143/jpsj.45.1067
Plain TextTakagi, Satio, Ishida, Kohtaro, Ootuka, Akio (1978) Observation of Dislocation in a Silicon Single Crystal by X-Ray Plane Wave Topography. Journal of the Physical Society of Japan, 45 (3). 1067-1068 doi:10.1143/jpsj.45.1067
In(1978, September) Journal of the Physical Society of Japan Vol. 45 (3) Physical Society of Japan

See Also

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Ishida, Kohtaro, Ootuka, Akio, Takagi, Satio (1981) A double-line image of a dislocation in a silicon single crystal observed by X-ray plane wave topography. Philosophical Magazine A, 43 (4). 935-944 doi:10.1080/01418618108239503
Ishida, Kohtaro, Kobayashi, Yoshinori, Katoh, Hiroyuki, Takagi, Satio (1983) Determination of the Sense of Burgers Vector by Plane-Wave X-ray Topography. Japanese Journal of Applied Physics, 22. doi:10.1143/jjap.22.l151
Takagi, Satio, Ishida, Kohtaro (1970) Intensity Distribution in Equal-Thickness Fringes in Electron Micrograph. Journal of the Physical Society of Japan, 28 (4). 1023-1030 doi:10.1143/jpsj.28.1023
Ishida, Kohtaro, Umezawa, Kikuo, Kawata, Masanobu, Takagi, Satio (1983) X-Ray Topographic Study on Rochelle Salt Crystal. Japanese Journal of Applied Physics, 22. doi:10.1143/jjap.22.l25
Kikuta, Seishi, Kohra, Kazutaka (1968) X-Ray Interference Fringes from a Wedge-Shaped Silicon Single Crystal Obtained by an Incident Plane Wave. Journal of the Physical Society of Japan, 25 (3). 923-924 doi:10.1143/jpsj.25.923
Takagi, Satio, Fujimoto, Fuminori (1960) Measurement of the Intensity in Electron Diffraction by a CdS Single Crystal. Journal of the Physical Society of Japan, 15 (9). 1607-1614 doi:10.1143/jpsj.15.1607
Kikuta, Seishi, Kohra, Kazutaka (1968) Erratum: “X-Ray Interference Fringes from a Wedge-Shaped Silicon Single Crystal Obtained by an Incident Plane Wave”. Journal of the Physical Society of Japan, 25 (4). 1206 doi:10.1143/jpsj.25.1206d
Kuribayashi, Masaru, Takumi, Katsuhiko, Kanamaru, Takuya, Katoh, Hiroyuki, Ishida, Kohtaro (1997) X-Ray Dispersion Corrections Obtained by Rocking Curve Measurements for Ge and GaAs Single Crystals. Journal of the Physical Society of Japan, 66 (3). 859-863 doi:10.1143/jpsj.66.859
Kotani, Akio (1978) Effect of Harmonics in Nearly Commensurate Spin-Density-Wave. Journal of the Physical Society of Japan, 45 (3). 766-774 doi:10.1143/jpsj.45.766
Takagi, Satio (1969) A Dynamical Theory of Diffraction for a Distorted Crystal. Journal of the Physical Society of Japan, 26 (5). 1239-1253 doi:10.1143/jpsj.26.1239
Ishida, Kohtaro, Kobayashi, Yoshinori, Katoh, Hiroyuki (1984) On the margin effect in section patterns obtained by plane-wave X-ray topography. Philosophical Magazine A, 49 (1). doi:10.1080/01418618408233437
 
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