Reference Type | Journal (article/letter/editorial) |
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Title | Microparacrystalline structure of amorphous Cd-As films |
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Journal | Zeitschrift für Kristallographie - Crystalline Materials |
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Authors | Burian, A. | Author |
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Lecante, P. | Author |
Mosset, A. | Author |
Galy, J. | Author |
Year | 1990 (January 1) | Volume | 193 |
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Issue | 3-4 |
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Publisher | Walter de Gruyter GmbH |
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DOI | doi:10.1524/zkri.1990.193.3-4.199Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 112265 | Long-form Identifier | mindat:1:5:112265:1 |
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GUID | 0 |
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Full Reference | Burian, A., Lecante, P., Mosset, A., Galy, J. (1990) Microparacrystalline structure of amorphous Cd-As films. Zeitschrift für Kristallographie - Crystalline Materials, 193 (3-4) 199 doi:10.1524/zkri.1990.193.3-4.199 |
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Plain Text | Burian, A., Lecante, P., Mosset, A., Galy, J. (1990) Microparacrystalline structure of amorphous Cd-As films. Zeitschrift für Kristallographie - Crystalline Materials, 193 (3-4) 199 doi:10.1524/zkri.1990.193.3-4.199 |
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In | (1990, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 193 (3-4) Walter de Gruyter GmbH |
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Abstract/Notes | AbstractA structural model of amorphous CdAs films in the composition range from 45 to 82 at.% As, based on the microparacrystalline theory, has been developed. An analysis of the X-ray diffraction data has been carried out by comparison of both experimental intensity |
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