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Shin, Young Chul, Kim, Eun Hong, Leem, Shi Jong, Kim, Tae Geun, Hahn, Cheol Koo (2007) Optical Properties of Europium-Silicate Thin Films Fabricated on Different SiOx Intermediate Layer. Journal of the Korean Physical Society, 50 (6). 1764pp. doi:10.3938/jkps.50.1764

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Reference TypeJournal (article/letter/editorial)
TitleOptical Properties of Europium-Silicate Thin Films Fabricated on Different SiOx Intermediate Layer
JournalJournal of the Korean Physical Society
AuthorsShin, Young ChulAuthor
Kim, Eun HongAuthor
Leem, Shi JongAuthor
Kim, Tae GeunAuthor
Hahn, Cheol KooAuthor
Year2007 (June 15)Volume50
Issue6
PublisherKorean Physical Society
DOIdoi:10.3938/jkps.50.1764Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID11231292Long-form Identifiermindat:1:5:11231292:7
GUID0
Full ReferenceShin, Young Chul, Kim, Eun Hong, Leem, Shi Jong, Kim, Tae Geun, Hahn, Cheol Koo (2007) Optical Properties of Europium-Silicate Thin Films Fabricated on Different SiOx Intermediate Layer. Journal of the Korean Physical Society, 50 (6). 1764pp. doi:10.3938/jkps.50.1764
Plain TextShin, Young Chul, Kim, Eun Hong, Leem, Shi Jong, Kim, Tae Geun, Hahn, Cheol Koo (2007) Optical Properties of Europium-Silicate Thin Films Fabricated on Different SiOx Intermediate Layer. Journal of the Korean Physical Society, 50 (6). 1764pp. doi:10.3938/jkps.50.1764
In(2007, June) Journal of the Korean Physical Society Vol. 50 (6) Korean Physical Society

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