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Grant, John T. (2007) Analysis of Surfaces and Thin Films by Using Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy. Journal of the Korean Physical Society, 51 (3). 925pp. doi:10.3938/jkps.51.925

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Reference TypeJournal (article/letter/editorial)
TitleAnalysis of Surfaces and Thin Films by Using Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
JournalJournal of the Korean Physical Society
AuthorsGrant, John T.Author
Year2007 (September 15)Volume51
Issue3
PublisherKorean Physical Society
DOIdoi:10.3938/jkps.51.925Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID11231915Long-form Identifiermindat:1:5:11231915:5
GUID0
Full ReferenceGrant, John T. (2007) Analysis of Surfaces and Thin Films by Using Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy. Journal of the Korean Physical Society, 51 (3). 925pp. doi:10.3938/jkps.51.925
Plain TextGrant, John T. (2007) Analysis of Surfaces and Thin Films by Using Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy. Journal of the Korean Physical Society, 51 (3). 925pp. doi:10.3938/jkps.51.925
In(2007, September) Journal of the Korean Physical Society Vol. 51 (3) Korean Physical Society

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