Reference Type | Journal (article/letter/editorial) |
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Title | Rietveld analysis using para-focusing and Debye-Scherrer geometry data collected with a Bragg-Brentano diffractometer * |
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Journal | Zeitschrift für Kristallographie - Crystalline Materials |
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Authors | Hill, R. J. | Author |
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Madsen, I. C. | Author |
Year | 1991 (January) | Volume | 196 |
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Issue | 1 |
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Publisher | Walter de Gruyter GmbH |
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DOI | doi:10.1524/zkri.1991.196.1-4.73Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 112546 | Long-form Identifier | mindat:1:5:112546:1 |
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GUID | 0 |
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Full Reference | Hill, R. J., Madsen, I. C. (1991) Rietveld analysis using para-focusing and Debye-Scherrer geometry data collected with a Bragg-Brentano diffractometer *. Zeitschrift für Kristallographie - Crystalline Materials, 196 (1) 73-92 doi:10.1524/zkri.1991.196.1-4.73 |
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Plain Text | Hill, R. J., Madsen, I. C. (1991) Rietveld analysis using para-focusing and Debye-Scherrer geometry data collected with a Bragg-Brentano diffractometer *. Zeitschrift für Kristallographie - Crystalline Materials, 196 (1) 73-92 doi:10.1524/zkri.1991.196.1-4.73 |
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In | (1991, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 196 (1) Walter de Gruyter GmbH |
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