| Reference Type | Journal (article/letter/editorial) |
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| Title | Electron crystallography of the polymethylene chain. 4. Defect distribution in lamellar interfaces of paraffin solid solutions |
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| Journal | Zeitschrift für Kristallographie - Crystalline Materials |
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| Authors | Dorset, Douglas L. | Author |
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| Year | 2000 (January 1) | Volume | 215 |
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| Issue | 3 |
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| Publisher | Walter de Gruyter GmbH |
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| DOI | doi:10.1524/zkri.2000.215.3.190Search in ResearchGate |
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| Mindat Ref. ID | 115917 | Long-form Identifier | mindat:1:5:115917:6 |
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| GUID | 0 |
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| Full Reference | Dorset, Douglas L. (2000) Electron crystallography of the polymethylene chain. 4. Defect distribution in lamellar interfaces of paraffin solid solutions. Zeitschrift für Kristallographie - Crystalline Materials, 215 (3) 190 doi:10.1524/zkri.2000.215.3.190 |
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| Plain Text | Dorset, Douglas L. (2000) Electron crystallography of the polymethylene chain. 4. Defect distribution in lamellar interfaces of paraffin solid solutions. Zeitschrift für Kristallographie - Crystalline Materials, 215 (3) 190 doi:10.1524/zkri.2000.215.3.190 |
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| In | (2000, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 215 (3) Walter de Gruyter GmbH |
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| Abstract/Notes | As is also found for paraffin lamellar crystals heated near the rotator or melt transition, the major change in electron diffraction patterns imposed by lamellar disorder in binary or multicomponent solid solutions is the attenuation and intensity modification of low-angle (00l) reflections. Using a Gaussian model for atomic occupancies near the interface, a systematic basis is found for the interfacial disorder thickness, describing the phenomenological ‘void’ distribution at the lamellar interface. (Vibrational spectroscopy has shown that this is actually a distribution of non-planar chain conformations.) Single crystal electron diffraction data from various co-soluble paraffin chain assemblies, used previously to determine their crystal structures (but also including a new determination for n-C |
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