| Reference Type | Journal (article/letter/editorial) |
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| Title | Crystal-chemical characterization of mixed-valent indium chalcogenides by X-ray absorption spectroscopy (EXAFS) |
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| Journal | Zeitschrift für Kristallographie - Crystalline Materials |
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| Authors | Epple, M. | Author |
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| Panthöfer, M. | Author |
| Walther, R. | Author |
| Deiseroth, H.J. | Author |
| Year | 2000 (January 1) | Volume | 215 |
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| Issue | 8 |
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| Publisher | Walter de Gruyter GmbH |
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| DOI | doi:10.1524/zkri.2000.215.8.445Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 115965 | Long-form Identifier | mindat:1:5:115965:7 |
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| GUID | 0 |
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| Full Reference | Epple, M., Panthöfer, M., Walther, R., Deiseroth, H.J. (2000) Crystal-chemical characterization of mixed-valent indium chalcogenides by X-ray absorption spectroscopy (EXAFS) Zeitschrift für Kristallographie - Crystalline Materials, 215 (8) 445 doi:10.1524/zkri.2000.215.8.445 |
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| Plain Text | Epple, M., Panthöfer, M., Walther, R., Deiseroth, H.J. (2000) Crystal-chemical characterization of mixed-valent indium chalcogenides by X-ray absorption spectroscopy (EXAFS) Zeitschrift für Kristallographie - Crystalline Materials, 215 (8) 445 doi:10.1524/zkri.2000.215.8.445 |
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| In | (2000, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 215 (8) Walter de Gruyter GmbH |
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| Abstract/Notes | The mixed-valent indium chalcogenides InTe, In |
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These are possibly similar items as determined by title/reference text matching only.
