Reference Type | Journal (article/letter/editorial) |
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Title | Effects of Alkaline Nano-SiO2 Abrasive on Planarization of 300mm Copper Patterned Wafer |
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Journal | Advanced Materials Research |
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Authors | Tang, Xin Liang | Author |
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Liu, Yu Ling | Author |
Zhang, Hong Yuan | Author |
Bao, Jie | Author |
Year | 2013 (January) | Volume | 634 |
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Publisher | Trans Tech Publications, Ltd. |
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DOI | doi:10.4028/www.scientific.net/amr.634-638.2949Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 11700113 | Long-form Identifier | mindat:1:5:11700113:0 |
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GUID | 0 |
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Full Reference | Tang, Xin Liang, Liu, Yu Ling, Zhang, Hong Yuan, Bao, Jie (2013) Effects of Alkaline Nano-SiO2 Abrasive on Planarization of 300mm Copper Patterned Wafer. Advanced Materials Research, 634. 2949-2954 doi:10.4028/www.scientific.net/amr.634-638.2949 |
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Plain Text | Tang, Xin Liang, Liu, Yu Ling, Zhang, Hong Yuan, Bao, Jie (2013) Effects of Alkaline Nano-SiO2 Abrasive on Planarization of 300mm Copper Patterned Wafer. Advanced Materials Research, 634. 2949-2954 doi:10.4028/www.scientific.net/amr.634-638.2949 |
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In | (n.d.) Advanced Materials Research Vol. 634. Trans Tech Publications, Ltd. |
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