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Bi, Dong Mei, Qiao, Liang, Hu, Xiao Ying, Liu, Shu Jie (2013) Geometrical and Electronic Structure Investigations of S-Doped Graphene. Advanced Materials Research, 669. 144-148 doi:10.4028/www.scientific.net/amr.669.144

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Reference TypeJournal (article/letter/editorial)
TitleGeometrical and Electronic Structure Investigations of S-Doped Graphene
JournalAdvanced Materials Research
AuthorsBi, Dong MeiAuthor
Qiao, LiangAuthor
Hu, Xiao YingAuthor
Liu, Shu JieAuthor
Year2013 (March)Volume669
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/amr.669.144Search in ResearchGate
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Mindat Ref. ID11704136Long-form Identifiermindat:1:5:11704136:5
GUID0
Full ReferenceBi, Dong Mei, Qiao, Liang, Hu, Xiao Ying, Liu, Shu Jie (2013) Geometrical and Electronic Structure Investigations of S-Doped Graphene. Advanced Materials Research, 669. 144-148 doi:10.4028/www.scientific.net/amr.669.144
Plain TextBi, Dong Mei, Qiao, Liang, Hu, Xiao Ying, Liu, Shu Jie (2013) Geometrical and Electronic Structure Investigations of S-Doped Graphene. Advanced Materials Research, 669. 144-148 doi:10.4028/www.scientific.net/amr.669.144
In(n.d.) Advanced Materials Research Vol. 669. Trans Tech Publications, Ltd.

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