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Lai, Jing Ming, Wang, Shi Hong, Xue, Feng, Liu, Ke, Chen, Jing (2013) An Intelligent Instruments Management System for Test Instruments. Applied Mechanics and Materials, 333. 2437-2441 doi:10.4028/www.scientific.net/amm.333-335.2437

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Reference TypeJournal (article/letter/editorial)
TitleAn Intelligent Instruments Management System for Test Instruments
JournalApplied Mechanics and Materials
AuthorsLai, Jing MingAuthor
Wang, Shi HongAuthor
Xue, FengAuthor
Liu, KeAuthor
Chen, JingAuthor
Year2013 (July)Volume333
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/amm.333-335.2437Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID11804983Long-form Identifiermindat:1:5:11804983:4
GUID0
Full ReferenceLai, Jing Ming, Wang, Shi Hong, Xue, Feng, Liu, Ke, Chen, Jing (2013) An Intelligent Instruments Management System for Test Instruments. Applied Mechanics and Materials, 333. 2437-2441 doi:10.4028/www.scientific.net/amm.333-335.2437
Plain TextLai, Jing Ming, Wang, Shi Hong, Xue, Feng, Liu, Ke, Chen, Jing (2013) An Intelligent Instruments Management System for Test Instruments. Applied Mechanics and Materials, 333. 2437-2441 doi:10.4028/www.scientific.net/amm.333-335.2437
In(n.d.) Applied Mechanics and Materials Vol. 333. Trans Tech Publications, Ltd.


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