Cheng, X.Q, Liu, B.X (2002) Formation of the ErSi2 phase and the associated fractal pattern on the Si surface upon high current Er-ion implantation. Journal of Alloys and Compounds, 336. 253-258 doi:10.1016/s0925-8388(01)01874-6
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Formation of the ErSi2 phase and the associated fractal pattern on the Si surface upon high current Er-ion implantation | ||
Journal | Journal of Alloys and Compounds | ||
Authors | Cheng, X.Q | Author | |
Liu, B.X | Author | ||
Year | 2002 (April) | Volume | 336 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/s0925-8388(01)01874-6Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 11882023 | Long-form Identifier | mindat:1:5:11882023:5 |
GUID | 0 | ||
Full Reference | Cheng, X.Q, Liu, B.X (2002) Formation of the ErSi2 phase and the associated fractal pattern on the Si surface upon high current Er-ion implantation. Journal of Alloys and Compounds, 336. 253-258 doi:10.1016/s0925-8388(01)01874-6 | ||
Plain Text | Cheng, X.Q, Liu, B.X (2002) Formation of the ErSi2 phase and the associated fractal pattern on the Si surface upon high current Er-ion implantation. Journal of Alloys and Compounds, 336. 253-258 doi:10.1016/s0925-8388(01)01874-6 | ||
In | (n.d.) Journal of Alloys and Compounds Vol. 336. Elsevier BV |
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