Radisavljević, I., Trigueiro, J., Bundaleski, N., Medić, M., Romčević, N., Teodoro, O.M.N.D., Mitrić, M., Ivanović, N. (2015) XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor. Journal of Alloys and Compounds, 632. 17-22 doi:10.1016/j.jallcom.2015.01.169
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor | ||
Journal | Journal of Alloys and Compounds | ||
Authors | Radisavljević, I. | Author | |
Trigueiro, J. | Author | ||
Bundaleski, N. | Author | ||
Medić, M. | Author | ||
Romčević, N. | Author | ||
Teodoro, O.M.N.D. | Author | ||
Mitrić, M. | Author | ||
Ivanović, N. | Author | ||
Year | 2015 (May) | Volume | 632 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.jallcom.2015.01.169Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 11908078 | Long-form Identifier | mindat:1:5:11908078:2 |
GUID | 0 | ||
Full Reference | Radisavljević, I., Trigueiro, J., Bundaleski, N., Medić, M., Romčević, N., Teodoro, O.M.N.D., Mitrić, M., Ivanović, N. (2015) XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor. Journal of Alloys and Compounds, 632. 17-22 doi:10.1016/j.jallcom.2015.01.169 | ||
Plain Text | Radisavljević, I., Trigueiro, J., Bundaleski, N., Medić, M., Romčević, N., Teodoro, O.M.N.D., Mitrić, M., Ivanović, N. (2015) XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor. Journal of Alloys and Compounds, 632. 17-22 doi:10.1016/j.jallcom.2015.01.169 | ||
In | (n.d.) Journal of Alloys and Compounds Vol. 632. Elsevier BV |
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