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Radisavljević, I., Trigueiro, J., Bundaleski, N., Medić, M., Romčević, N., Teodoro, O.M.N.D., Mitrić, M., Ivanović, N. (2015) XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor. Journal of Alloys and Compounds, 632. 17-22 doi:10.1016/j.jallcom.2015.01.169

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Reference TypeJournal (article/letter/editorial)
TitleXAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor
JournalJournal of Alloys and Compounds
AuthorsRadisavljević, I.Author
Trigueiro, J.Author
Bundaleski, N.Author
Medić, M.Author
Romčević, N.Author
Teodoro, O.M.N.D.Author
Mitrić, M.Author
Ivanović, N.Author
Year2015 (May)Volume632
PublisherElsevier BV
DOIdoi:10.1016/j.jallcom.2015.01.169Search in ResearchGate
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Mindat Ref. ID11908078Long-form Identifiermindat:1:5:11908078:2
GUID0
Full ReferenceRadisavljević, I., Trigueiro, J., Bundaleski, N., Medić, M., Romčević, N., Teodoro, O.M.N.D., Mitrić, M., Ivanović, N. (2015) XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor. Journal of Alloys and Compounds, 632. 17-22 doi:10.1016/j.jallcom.2015.01.169
Plain TextRadisavljević, I., Trigueiro, J., Bundaleski, N., Medić, M., Romčević, N., Teodoro, O.M.N.D., Mitrić, M., Ivanović, N. (2015) XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor. Journal of Alloys and Compounds, 632. 17-22 doi:10.1016/j.jallcom.2015.01.169
In(n.d.) Journal of Alloys and Compounds Vol. 632. Elsevier BV


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