Reference Type | Journal (article/letter/editorial) |
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Title | An In Situ Measuring Method for Young's Modulus of a MEMS Film Base on Resonance Frequency |
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Journal | Key Engineering Materials |
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Authors | Chen, Han | Author |
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Rong, Hua | Author |
Year | 2012 (February) | Volume | 503 |
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Publisher | Trans Tech Publications, Ltd. |
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DOI | doi:10.4028/www.scientific.net/kem.503.308Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 12012502 | Long-form Identifier | mindat:1:5:12012502:1 |
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GUID | 0 |
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Full Reference | Chen, Han, Rong, Hua (2012) An In Situ Measuring Method for Young's Modulus of a MEMS Film Base on Resonance Frequency. Key Engineering Materials, 503. 308-311 doi:10.4028/www.scientific.net/kem.503.308 |
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Plain Text | Chen, Han, Rong, Hua (2012) An In Situ Measuring Method for Young's Modulus of a MEMS Film Base on Resonance Frequency. Key Engineering Materials, 503. 308-311 doi:10.4028/www.scientific.net/kem.503.308 |
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In | (n.d.) Key Engineering Materials Vol. 503. Trans Tech Publications, Ltd. |
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