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Lu, Ming Yuan, Xie, Hong Tao, Huang, Han (2012) Characterisation of Interfacial Adhesion of Thin Film/Substrate Systems Using Indentation-Induced Delamination: A Focused Review. Key Engineering Materials, 533. 201-222 doi:10.4028/www.scientific.net/kem.533.201

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Reference TypeJournal (article/letter/editorial)
TitleCharacterisation of Interfacial Adhesion of Thin Film/Substrate Systems Using Indentation-Induced Delamination: A Focused Review
JournalKey Engineering Materials
AuthorsLu, Ming YuanAuthor
Xie, Hong TaoAuthor
Huang, HanAuthor
Year2012 (December)Volume533
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/kem.533.201Search in ResearchGate
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Mindat Ref. ID12014779Long-form Identifiermindat:1:5:12014779:5
GUID0
Full ReferenceLu, Ming Yuan, Xie, Hong Tao, Huang, Han (2012) Characterisation of Interfacial Adhesion of Thin Film/Substrate Systems Using Indentation-Induced Delamination: A Focused Review. Key Engineering Materials, 533. 201-222 doi:10.4028/www.scientific.net/kem.533.201
Plain TextLu, Ming Yuan, Xie, Hong Tao, Huang, Han (2012) Characterisation of Interfacial Adhesion of Thin Film/Substrate Systems Using Indentation-Induced Delamination: A Focused Review. Key Engineering Materials, 533. 201-222 doi:10.4028/www.scientific.net/kem.533.201
In(n.d.) Key Engineering Materials Vol. 533. Trans Tech Publications, Ltd.

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(2012) Key Engineering Materials, 533. Trans Tech Publications, Ltd. doi:10.4028/www.scientific.net/kem.533
Veluri, Badrinath, Jensen, Henrik Myhre (2012) Modeling Delamination of Interfacial Corner Cracks in Multilayered Structures. Key Engineering Materials, 525. 509-512 doi:10.4028/www.scientific.net/kem.525-526.509
Huang, Bin, Zhao, Ming-Hao, Zhang, Tong-Yi (2004) Indentation fracture and indentation delamination in ZnO film/Si substrate systems. Philosophical Magazine, 84 (12). 1233-1256 doi:10.1080/14786430310001653116
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