Rotsch, Christian, Radmacher, Manfred (1997) Mapping Local Electrostatic Forces with the Atomic Force Microscope. Langmuir, 13. 2825-2832 doi:10.1021/la960874s
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Mapping Local Electrostatic Forces with the Atomic Force Microscope | ||
Journal | Langmuir | ||
Authors | Rotsch, Christian | Author | |
Radmacher, Manfred | Author | ||
Year | 1997 (May) | Volume | 13 |
Publisher | American Chemical Society (ACS) | ||
DOI | doi:10.1021/la960874sSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 12085846 | Long-form Identifier | mindat:1:5:12085846:2 |
GUID | 0 | ||
Full Reference | Rotsch, Christian, Radmacher, Manfred (1997) Mapping Local Electrostatic Forces with the Atomic Force Microscope. Langmuir, 13. 2825-2832 doi:10.1021/la960874s | ||
Plain Text | Rotsch, Christian, Radmacher, Manfred (1997) Mapping Local Electrostatic Forces with the Atomic Force Microscope. Langmuir, 13. 2825-2832 doi:10.1021/la960874s | ||
In | (n.d.) Langmuir Vol. 13. American Chemical Society (ACS) |
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