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Stock, S.R., Chasnov, R., Chen, Haydn., Birnbaum, H.K. (1983) X-ray topography of hydride domains. Materials Letters, 2. 173-175 doi:10.1016/0167-577x(83)90063-0

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Reference TypeJournal (article/letter/editorial)
TitleX-ray topography of hydride domains
JournalMaterials Letters
AuthorsStock, S.R.Author
Chasnov, R.Author
Chen, Haydn.Author
Birnbaum, H.K.Author
Year1983 (October)Volume2
PublisherElsevier BV
DOIdoi:10.1016/0167-577x(83)90063-0Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID12403713Long-form Identifiermindat:1:5:12403713:9
GUID0
Full ReferenceStock, S.R., Chasnov, R., Chen, Haydn., Birnbaum, H.K. (1983) X-ray topography of hydride domains. Materials Letters, 2. 173-175 doi:10.1016/0167-577x(83)90063-0
Plain TextStock, S.R., Chasnov, R., Chen, Haydn., Birnbaum, H.K. (1983) X-ray topography of hydride domains. Materials Letters, 2. 173-175 doi:10.1016/0167-577x(83)90063-0
In(n.d.) Materials Letters Vol. 2. Elsevier BV

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Stock, S.R., Greenstein, M., Rigsbee, J.M. (1988) X-ray diffraction topography of deformation accompanying laser drilling of silicon. Materials Letters, 7. 87-93 doi:10.1016/0167-577x(88)90131-0
Rosemeier, R.G., Yoo, K.C., Johnson, S.M. (1983) Polycrystal X-ray topography (PXT) of a cast silicon photovoltaic cell. Materials Letters, 1. 194-196 doi:10.1016/0167-577x(83)90016-2
Chen, Haydn, White, G.E., Stock, S.R. (1986) Measurement of thermal stress in Pd2Si film on Si(111) by absorption edge contour mapping. Materials Letters, 4. 61-64 doi:10.1016/0167-577x(86)90050-9
Stock, S.R., Chen, Haydn, Birnbaum, H.K. (1987) Growth of thin niobium crystals by the strain-anneal method. Journal of Crystal Growth, 84 (3). 419-424 doi:10.1016/0022-0248(87)90271-5
(1983) MRS News. Materials Letters, 2. doi:10.1016/0167-577x(83)90040-x
(1983) Editorial Board. Materials Letters, 2. doi:10.1016/0167-577x(83)90019-8
(1983) MRS news. Materials Letters, 2. doi:10.1016/0167-577x(83)90065-4
White, G.E., Chen, Haydn (1984) Variation of Pendellösung fringes in elastically deformed silicon single crystals. Materials Letters, 2. 347-350 doi:10.1016/0167-577x(84)90051-x
Chen, Haydn (1986) Observation of pendellösung fringes in reflection-section topographs of bent silicon crystals. Materials Letters, 4. 65-70 doi:10.1016/0167-577x(86)90051-0
Shimada, M., Suzuki, T., Koizumi, M. (1983) Fabrication and characterization of TiC1−xNX (0 ⩽x ⩽ 1) and Mo2B2−xCx (x = 0,1.0,2.0) by high-pressure hot-pressing. Materials Letters, 1. 175-177 doi:10.1016/0167-577x(83)90011-3
Stock, S. R., Chen, Haydn, Birnbaum, H. K. (1986) The measurement of strain fields by X-ray topographic contour mapping. Philosophical Magazine A, 53 (1). 73-86 doi:10.1080/01418618608242808
 
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