| Reference Type | Journal (article/letter/editorial) |
|---|
| Title | Trace element diffusion in rhyolitic melts: comparison between synchrotron radiation X-ray fluorescence microanalysis (-SRXRF) and secondary ion mass spectrometry (SIMS) |
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| Journal | European Journal of Mineralogy |
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| Authors | Hahn, Matthias | Author |
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| Behrens, Harald | Author |
| Tegge-Schüring, Astrid | Author |
| Koepke, Jürgen | Author |
| Horn, Ingo | Author |
| Rickers, Karen | Author |
| Falkenberg, Gerald | Author |
| Wiedenbeck, Michael | Author |
| Year | 2005 (April 29) | Volume | 17 |
|---|
| Issue | 2 |
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| Publisher | Schweizerbart |
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| DOI | doi:10.1127/0935-1221/2005/0017-0233Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 128437 | Long-form Identifier | mindat:1:5:128437:3 |
|---|
|
| GUID | 0 |
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| Full Reference | Hahn, Matthias, Behrens, Harald, Tegge-Schüring, Astrid, Koepke, Jürgen, Horn, Ingo, Rickers, Karen, Falkenberg, Gerald, Wiedenbeck, Michael (2005) Trace element diffusion in rhyolitic melts: comparison between synchrotron radiation X-ray fluorescence microanalysis (-SRXRF) and secondary ion mass spectrometry (SIMS) European Journal of Mineralogy, 17 (2) 233-242 doi:10.1127/0935-1221/2005/0017-0233 |
|---|
| Plain Text | Hahn, Matthias, Behrens, Harald, Tegge-Schüring, Astrid, Koepke, Jürgen, Horn, Ingo, Rickers, Karen, Falkenberg, Gerald, Wiedenbeck, Michael (2005) Trace element diffusion in rhyolitic melts: comparison between synchrotron radiation X-ray fluorescence microanalysis (-SRXRF) and secondary ion mass spectrometry (SIMS) European Journal of Mineralogy, 17 (2) 233-242 doi:10.1127/0935-1221/2005/0017-0233 |
|---|
| In | (2005, April) European Journal of Mineralogy Vol. 17 (2) Schweizerbart |
|---|
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