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Jugovac, Matteo, Menteş, Tevfik Onur, Genuzio, Francesca, Lachnitt, Jan, Feyer, Vitaliy, Flege, Jan Ingo, Locatelli, Andrea (2021) Sensitivity to crystal stacking in low-energy electron microscopy. Applied Surface Science, 566. 150656pp. doi:10.1016/j.apsusc.2021.150656

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Reference TypeJournal (article/letter/editorial)
TitleSensitivity to crystal stacking in low-energy electron microscopy
JournalApplied Surface Science
AuthorsJugovac, MatteoAuthor
Menteş, Tevfik OnurAuthor
Genuzio, FrancescaAuthor
Lachnitt, JanAuthor
Feyer, VitaliyAuthor
Flege, Jan IngoAuthor
Locatelli, AndreaAuthor
Year2021 (November)Volume566
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2021.150656Search in ResearchGate
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Mindat Ref. ID13133037Long-form Identifiermindat:1:5:13133037:7
GUID0
Full ReferenceJugovac, Matteo, Menteş, Tevfik Onur, Genuzio, Francesca, Lachnitt, Jan, Feyer, Vitaliy, Flege, Jan Ingo, Locatelli, Andrea (2021) Sensitivity to crystal stacking in low-energy electron microscopy. Applied Surface Science, 566. 150656pp. doi:10.1016/j.apsusc.2021.150656
Plain TextJugovac, Matteo, Menteş, Tevfik Onur, Genuzio, Francesca, Lachnitt, Jan, Feyer, Vitaliy, Flege, Jan Ingo, Locatelli, Andrea (2021) Sensitivity to crystal stacking in low-energy electron microscopy. Applied Surface Science, 566. 150656pp. doi:10.1016/j.apsusc.2021.150656
In(2021) Applied Surface Science Vol. 566. Elsevier BV

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