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Shin, Hyun Wook, Shin, Young-Han, Son, Jong Yeog (2021) Resistive switching characteristics of epitaxial NiO thin films affected by lattice strains and external forces. Applied Surface Science, 566. 150685pp. doi:10.1016/j.apsusc.2021.150685

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Reference TypeJournal (article/letter/editorial)
TitleResistive switching characteristics of epitaxial NiO thin films affected by lattice strains and external forces
JournalApplied Surface Science
AuthorsShin, Hyun WookAuthor
Shin, Young-HanAuthor
Son, Jong YeogAuthor
Year2021 (November)Volume566
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2021.150685Search in ResearchGate
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Mindat Ref. ID13133068Long-form Identifiermindat:1:5:13133068:1
GUID0
Full ReferenceShin, Hyun Wook, Shin, Young-Han, Son, Jong Yeog (2021) Resistive switching characteristics of epitaxial NiO thin films affected by lattice strains and external forces. Applied Surface Science, 566. 150685pp. doi:10.1016/j.apsusc.2021.150685
Plain TextShin, Hyun Wook, Shin, Young-Han, Son, Jong Yeog (2021) Resistive switching characteristics of epitaxial NiO thin films affected by lattice strains and external forces. Applied Surface Science, 566. 150685pp. doi:10.1016/j.apsusc.2021.150685
In(2021) Applied Surface Science Vol. 566. Elsevier BV

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Shin, Hyun Wook, Son, Jong Yeog (2023) Leakage current characteristics affected by crystallinity and domain wall current of epitaxial Bi5Ti3FeO15 thin films. Journal of Applied Physics, 134 (18) doi:10.1063/5.0173297
Shin, Hyun Wook, Son, Jong Yeog (2019) Resistive switching characteristics of graphene/NiO/highly ordered pyrolytic graphite resistive random access memory capacitors. Journal of Alloys and Compounds, 772. 900-904 doi:10.1016/j.jallcom.2018.09.181
Son, Jong Yeog, Shin, Yun-Sok, Shin, Young-Han (2011) Nanoscale resistive random access memory consisting of a NiO nanodot and Au nanowires formed by dip-pen nanolithography. Applied Surface Science, 257. 9885-9887 doi:10.1016/j.apsusc.2011.06.076
Ahn, Yoonho, Shin, Hyun Wook, Lee, Tae Hoon, Kim, Woo-Hee, Son, Jong Yeog (2018) Effects of a Nb nanopin electrode on the resistive random-access memory switching characteristics of NiO thin films. Nanoscale, 10. 13443-13448 doi:10.1039/c8nr02986e
Shin, Hyun Wook, Son, Jong Yeog (2023) Leakage current characteristics of polycrystalline BiFeO3 thin films affected by thickness-dependent domain wall currents. Journal of Alloys and Compounds, 968. 172113 doi:10.1016/j.jallcom.2023.172113
Shin, Hyun Wook, Son, Jong Yeog (2019) Flexoelectric switching characteristics depending on crystallinity of highly c-oriented epitaxial SrBi2Nb2O9 thin film. Journal of Alloys and Compounds, 788. 311-317 doi:10.1016/j.jallcom.2019.02.161
Shin, Hyun Wook, Son, Jong Yeog (2021) Nonvolatile-memory current characteristics of BiFeO3 nanodots switched by applying external bias and force. Ceramics International, 47 (20) 28449-28454 doi:10.1016/j.ceramint.2021.06.263
Tak Lim, Yun, Yeog Son, Jong, Shin, Young-Han (2014) Domain switching of fatigued ferroelectric thin films. Applied Physics Letters, 104 (19). 192902pp. doi:10.1063/1.4876605
Shin, Hyun Wook, Son, Jong Yeog (2021) Tetragonally strained crystal structure and ferroelectric properties of epitaxial PbTiO3 thin films grown on single-crystal Rh substrates. Materials Chemistry and Physics, 264. 124477pp. doi:10.1016/j.matchemphys.2021.124477
Ryu, Sangwoo, Son, Jong Yeog, Shin, Young-Han, Jang, Hyun M., Scott, James F. (2009) Polarization switching characteristics of BiFeO3 thin films epitaxially grown on Pt/MgO at a low temperature. Applied Physics Letters, 95 (24). 242902pp. doi:10.1063/1.3275012
Shin, Hyun Wook, Son, Jong Yeog (2019) Enhanced multiferroic properties of tetragonally strained epitaxial BiMnO3 thin films grown on single crystal Rh substrates. Solid State Sciences, 91. 7-9 doi:10.1016/j.solidstatesciences.2019.03.003
 
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