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(2004) X-ray powder diffraction analysis and initial Rietveld characterization of SmAlSi and SmAlGe. Powder Diffraction, 19 (4) 359-361 doi:10.1154/1.1803839

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Reference TypeJournal (article/letter/editorial)
TitleX-ray powder diffraction analysis and initial Rietveld characterization of SmAlSi and SmAlGe
JournalPowder Diffraction
Year2004 (December)Volume19
Issue4
PublisherCambridge University Press (CUP)
DOIdoi:10.1154/1.1803839Search in ResearchGate
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Mindat Ref. ID13254562Long-form Identifiermindat:1:5:13254562:6
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Full Reference(2004) X-ray powder diffraction analysis and initial Rietveld characterization of SmAlSi and SmAlGe. Powder Diffraction, 19 (4) 359-361 doi:10.1154/1.1803839
Plain Text(2004) X-ray powder diffraction analysis and initial Rietveld characterization of SmAlSi and SmAlGe. Powder Diffraction, 19 (4) 359-361 doi:10.1154/1.1803839
In(2004, December) Powder Diffraction Vol. 19 (4) Cambridge University Press (CUP)

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