Reference Type | Journal (article/letter/editorial) |
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Title | Characterization of materials embedded in thick objects using spectral small-angle x-ray scattering |
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Journal | Journal of Physics D: Applied Physics |
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Authors | Dahal, Eshan | Author |
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Ghammraoui, Bahaa | Author |
Badano, Aldo | Author |
Year | 2020 (June 10) | Volume | 53 |
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Issue | 24 |
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Publisher | IOP Publishing |
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DOI | doi:10.1088/1361-6463/ab8248Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 13565547 | Long-form Identifier | mindat:1:5:13565547:6 |
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GUID | 0 |
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Full Reference | Dahal, Eshan, Ghammraoui, Bahaa, Badano, Aldo (2020) Characterization of materials embedded in thick objects using spectral small-angle x-ray scattering. Journal of Physics D: Applied Physics, 53 (24) 245302pp. doi:10.1088/1361-6463/ab8248 |
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Plain Text | Dahal, Eshan, Ghammraoui, Bahaa, Badano, Aldo (2020) Characterization of materials embedded in thick objects using spectral small-angle x-ray scattering. Journal of Physics D: Applied Physics, 53 (24) 245302pp. doi:10.1088/1361-6463/ab8248 |
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In | (2020, June) Journal of Physics D: Applied Physics Vol. 53 (24) IOP Publishing |
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