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Ding, S. Y., Li, J., Shao, H. M., Lin, J. W., Ren, C., Yao, X. X. (1996) Nonlinear effective barriers for flux diffusion and critical current density ofHgBa2Ca2Cu3Oxbased upon ac susceptibility measurement. Physical Review B, 53 (2) 900-904 doi:10.1103/physrevb.53.900

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Reference TypeJournal (article/letter/editorial)
TitleNonlinear effective barriers for flux diffusion and critical current density ofHgBa2Ca2Cu3Oxbased upon ac susceptibility measurement
JournalPhysical Review B
AuthorsDing, S. Y.Author
Li, J.Author
Shao, H. M.Author
Lin, J. W.Author
Ren, C.Author
Yao, X. X.Author
Year1996 (January 1)Volume53
Issue2
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.53.900Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14133066Long-form Identifiermindat:1:5:14133066:4
GUID0
Full ReferenceDing, S. Y., Li, J., Shao, H. M., Lin, J. W., Ren, C., Yao, X. X. (1996) Nonlinear effective barriers for flux diffusion and critical current density ofHgBa2Ca2Cu3Oxbased upon ac susceptibility measurement. Physical Review B, 53 (2) 900-904 doi:10.1103/physrevb.53.900
Plain TextDing, S. Y., Li, J., Shao, H. M., Lin, J. W., Ren, C., Yao, X. X. (1996) Nonlinear effective barriers for flux diffusion and critical current density ofHgBa2Ca2Cu3Oxbased upon ac susceptibility measurement. Physical Review B, 53 (2) 900-904 doi:10.1103/physrevb.53.900
In(1996, January) Physical Review B Vol. 53 (2) American Physical Society (APS)

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Ren, C., Ding, S. Y., Zheng, Z. Y., Qin, M. J., Yao, X. X., Fu, Y. X., Cai, C. B. (1996) Dependence of the flux-creep time scale on sample size for melt-texturedYBa2Cu3O7by ac-susceptibility measurements. Physical Review B, 53 (17) 11348-11351 doi:10.1103/physrevb.53.11348
Ding, S. Y., Lin, J. W., Wang, G. Q., Ren, C., Jin, X., Yao, X. X., Peng, H. T., Peng, Q. Y., Zhou, S. H. (1995) Critical current and its determination on TlSr2Ca2Ba2Cu3Oyby ac susceptibility measurement. Journal of Applied Physics, 77 (12). 6394-6397 doi:10.1063/1.359112
Rui, Y., Ji, H. L., Xu, X. N., Shao, H. M., Qin, M. J., Jin, X., Yao, X. X., Rong, X. S., Ying, B., Zhao, Z. X. (1995) Nonlinear effective activation energy and field dependence of the critical current density inHgBa2Ca2Cu3O8+δ. Physical Review B, 51 (14) 9161-9166 doi:10.1103/physrevb.51.9161
Ding, S. Y., Ren, C., Yi, H. J., Zeng, Z. Y., Yao, X. X., Fu, Y. X., Cai, C. B. (1996) Anisotropy of flux dynamics forYBa2Cu3O7. Physical Review B, 54 (22) 16211-16215 doi:10.1103/physrevb.54.16211
Ding, S. Y., Wang, G. Q., Yao, X. X., Peng, H. T., Peng, Q. Y., Zhou, S. H. (1995) Magnetic relaxation and the flux diffusion barrier forTlSr2Ca2Cu3Oydoped with Pb and Ba determined by complex ac susceptibility measurements. Physical Review B, 51 (14) 9107-9110 doi:10.1103/physrevb.51.9107
Qin, M. J., Yao, X. X. (1996) ac susceptibility of high-temperature superconductors. Physical Review B, 54 (10) 7536-7544 doi:10.1103/physrevb.54.7536
Leng, X., Ding, S. Y., Liu, Y., Wang, Z. H., Liu, H. K., Dou, S. X. (2003) Dip effect in ac susceptibility due to surface barrier with flux creep. Physical Review B, 68 (21) doi:10.1103/physrevb.68.214511
Kumaraswamy, B. V., Lal, R., Narlikar, A. V. (1996) ac-susceptibility study of critical current density in metal-substitutedErBa2Cu3O7−δ. Physical Review B, 53 (10) 6759-6763 doi:10.1103/physrevb.53.6759
Zhang, T. H., Yang, J., Kang, H. Z., Feng, L., Xu, J. J., Zhang, C. P., Ren, X. K., Wang, B. H., Lu, Y. Z., Jia, F., Shao, W. W. (2006) Surface second-harmonic generation inSr0.6Ba0.4NbO3with a nonlinear diffusion mechanism. Physical Review B, 73 (15) doi:10.1103/physrevb.73.153402
Xu, S. Y., Li, Qi, Wertz, E., Hu, Y. F., Pogrebnyakov, A. V., Zeng, X. H., Xi, X. X., Redwing, J. M. (2003) High critical current density and vortex pinning of epitaxialMgB2thin films. Physical Review B, 68 (22) doi:10.1103/physrevb.68.224501
Jönsson, B. J., Rao, K. V., Yun, S. H., Karlsson, U. O. (1998) Method to extract the critical current density and the flux-creep exponent in high-Tcthin films using ac susceptibility measurements. Physical Review B, 58 (9) 5862-5867 doi:10.1103/physrevb.58.5862
 
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