Reference Type | Journal (article/letter/editorial) |
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Title | Experimental evidence indicating a global mechanism for light-induced degradation in hydrogenated amorphous silicon |
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Journal | Physical Review B |
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Authors | Palinginis, Kimon C. | Author |
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Cohen, J. David | Author |
Guha, Subhendu | Author |
Yang, Jeffrey C. | Author |
Year | 2001 (May 7) | Volume | 63 |
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Issue | 20 |
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Publisher | American Physical Society (APS) |
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DOI | doi:10.1103/physrevb.63.201203Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 14156661 | Long-form Identifier | mindat:1:5:14156661:2 |
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GUID | 0 |
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Full Reference | Palinginis, Kimon C., Cohen, J. David, Guha, Subhendu, Yang, Jeffrey C. (2001) Experimental evidence indicating a global mechanism for light-induced degradation in hydrogenated amorphous silicon. Physical Review B, 63 (20) doi:10.1103/physrevb.63.201203 |
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Plain Text | Palinginis, Kimon C., Cohen, J. David, Guha, Subhendu, Yang, Jeffrey C. (2001) Experimental evidence indicating a global mechanism for light-induced degradation in hydrogenated amorphous silicon. Physical Review B, 63 (20) doi:10.1103/physrevb.63.201203 |
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In | (2001, May) Physical Review B Vol. 63 (20) American Physical Society (APS) |
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