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Palinginis, Kimon C., Cohen, J. David, Guha, Subhendu, Yang, Jeffrey C. (2001) Experimental evidence indicating a global mechanism for light-induced degradation in hydrogenated amorphous silicon. Physical Review B, 63 (20) doi:10.1103/physrevb.63.201203

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Reference TypeJournal (article/letter/editorial)
TitleExperimental evidence indicating a global mechanism for light-induced degradation in hydrogenated amorphous silicon
JournalPhysical Review B
AuthorsPalinginis, Kimon C.Author
Cohen, J. DavidAuthor
Guha, SubhenduAuthor
Yang, Jeffrey C.Author
Year2001 (May 7)Volume63
Issue20
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.63.201203Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14156661Long-form Identifiermindat:1:5:14156661:2
GUID0
Full ReferencePalinginis, Kimon C., Cohen, J. David, Guha, Subhendu, Yang, Jeffrey C. (2001) Experimental evidence indicating a global mechanism for light-induced degradation in hydrogenated amorphous silicon. Physical Review B, 63 (20) doi:10.1103/physrevb.63.201203
Plain TextPalinginis, Kimon C., Cohen, J. David, Guha, Subhendu, Yang, Jeffrey C. (2001) Experimental evidence indicating a global mechanism for light-induced degradation in hydrogenated amorphous silicon. Physical Review B, 63 (20) doi:10.1103/physrevb.63.201203
In(2001, May) Physical Review B Vol. 63 (20) American Physical Society (APS)


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