Oh, J. H., Yeom, H. W., Hagimoto, Y., Ono, K., Oshima, M., Hirashita, N., Nywa, M., Toriumi, A., Kakizaki, A. (2001) Chemical structure of the ultrathinSiO2/Si(100)interface: An angle-resolved Si2pphotoemission study. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205310
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Chemical structure of the ultrathinSiO2/Si(100)interface: An angle-resolved Si2pphotoemission study | ||
| Journal | Physical Review B | ||
| Authors | Oh, J. H. | Author | |
| Yeom, H. W. | Author | ||
| Hagimoto, Y. | Author | ||
| Ono, K. | Author | ||
| Oshima, M. | Author | ||
| Hirashita, N. | Author | ||
| Nywa, M. | Author | ||
| Toriumi, A. | Author | ||
| Kakizaki, A. | Author | ||
| Year | 2001 (April 24) | Volume | 63 |
| Issue | 20 | ||
| Publisher | American Physical Society (APS) | ||
| DOI | doi:10.1103/physrevb.63.205310Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 14156713 | Long-form Identifier | mindat:1:5:14156713:8 |
| GUID | 0 | ||
| Full Reference | Oh, J. H., Yeom, H. W., Hagimoto, Y., Ono, K., Oshima, M., Hirashita, N., Nywa, M., Toriumi, A., Kakizaki, A. (2001) Chemical structure of the ultrathinSiO2/Si(100)interface: An angle-resolved Si2pphotoemission study. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205310 | ||
| Plain Text | Oh, J. H., Yeom, H. W., Hagimoto, Y., Ono, K., Oshima, M., Hirashita, N., Nywa, M., Toriumi, A., Kakizaki, A. (2001) Chemical structure of the ultrathinSiO2/Si(100)interface: An angle-resolved Si2pphotoemission study. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205310 | ||
| In | (2001, May) Physical Review B Vol. 63 (20) American Physical Society (APS) | ||
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