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Nelson, Jenny, Haque, Saif A., Klug, David R., Durrant, James R. (2001) Trap-limited recombination in dye-sensitized nanocrystalline metal oxide electrodes. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205321

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Reference TypeJournal (article/letter/editorial)
TitleTrap-limited recombination in dye-sensitized nanocrystalline metal oxide electrodes
JournalPhysical Review B
AuthorsNelson, JennyAuthor
Haque, Saif A.Author
Klug, David R.Author
Durrant, James R.Author
Year2001 (May 3)Volume63
Issue20
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.63.205321Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14156724Long-form Identifiermindat:1:5:14156724:4
GUID0
Full ReferenceNelson, Jenny, Haque, Saif A., Klug, David R., Durrant, James R. (2001) Trap-limited recombination in dye-sensitized nanocrystalline metal oxide electrodes. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205321
Plain TextNelson, Jenny, Haque, Saif A., Klug, David R., Durrant, James R. (2001) Trap-limited recombination in dye-sensitized nanocrystalline metal oxide electrodes. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205321
In(2001, May) Physical Review B Vol. 63 (20) American Physical Society (APS)


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