Nelson, Jenny, Haque, Saif A., Klug, David R., Durrant, James R. (2001) Trap-limited recombination in dye-sensitized nanocrystalline metal oxide electrodes. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205321
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Trap-limited recombination in dye-sensitized nanocrystalline metal oxide electrodes | ||
Journal | Physical Review B | ||
Authors | Nelson, Jenny | Author | |
Haque, Saif A. | Author | ||
Klug, David R. | Author | ||
Durrant, James R. | Author | ||
Year | 2001 (May 3) | Volume | 63 |
Issue | 20 | ||
Publisher | American Physical Society (APS) | ||
DOI | doi:10.1103/physrevb.63.205321Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 14156724 | Long-form Identifier | mindat:1:5:14156724:4 |
GUID | 0 | ||
Full Reference | Nelson, Jenny, Haque, Saif A., Klug, David R., Durrant, James R. (2001) Trap-limited recombination in dye-sensitized nanocrystalline metal oxide electrodes. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205321 | ||
Plain Text | Nelson, Jenny, Haque, Saif A., Klug, David R., Durrant, James R. (2001) Trap-limited recombination in dye-sensitized nanocrystalline metal oxide electrodes. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205321 | ||
In | (2001, May) Physical Review B Vol. 63 (20) American Physical Society (APS) |
See Also
These are possibly similar items as determined by title/reference text matching only.