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Reuter, K., de Andres, P. L., Garcia-Vidal, F. J., Flores, F., Heinz, K. (2001) Surface and bulk band-structure effects onCoSi2/Si(111)ballistic-electron emission experiments. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205325

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Reference TypeJournal (article/letter/editorial)
TitleSurface and bulk band-structure effects onCoSi2/Si(111)ballistic-electron emission experiments
JournalPhysical Review B
AuthorsReuter, K.Author
de Andres, P. L.Author
Garcia-Vidal, F. J.Author
Flores, F.Author
Heinz, K.Author
Year2001 (May 7)Volume63
Issue20
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.63.205325Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14156728Long-form Identifiermindat:1:5:14156728:2
GUID0
Full ReferenceReuter, K., de Andres, P. L., Garcia-Vidal, F. J., Flores, F., Heinz, K. (2001) Surface and bulk band-structure effects onCoSi2/Si(111)ballistic-electron emission experiments. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205325
Plain TextReuter, K., de Andres, P. L., Garcia-Vidal, F. J., Flores, F., Heinz, K. (2001) Surface and bulk band-structure effects onCoSi2/Si(111)ballistic-electron emission experiments. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205325
In(2001, May) Physical Review B Vol. 63 (20) American Physical Society (APS)

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Reuter, K., Garcia-Vidal, F. J., de Andres, P. L., Flores, F., Heinz, K. (1998) Ballistic Electron Emission Microscopy onCoSi2/Si(111)Interfaces: Band Structure Induced Atomic-Scale Resolution and Role of Localized Surface States. Physical Review Letters, 81 (22). 4963-4966 doi:10.1103/physrevlett.81.4963
Reuter, K., de Andres, P. L., Garcia-Vidal, F. J., Sestovic, D., Flores, F., Heinz, K. (1998) Quantum-mechanical analysis of the elastic propagation of electrons in the Au/Si system: Application to ballistic-electron-emission microscopy. Physical Review B, 58 (20) 14036-14046 doi:10.1103/physrevb.58.14036
Reuter, K., Hohenester, U., de Andres, P. L., García-Vidal, F. J., Flores, F., Heinz, K., Kocevar, P. (2000) Electron energy relaxation times from ballistic-electron-emission spectroscopy. Physical Review B, 61 (7) 4522-4525 doi:10.1103/physrevb.61.4522
Reuter, K, Andres, P. L. de, Garcia-Vidal, F. J, Flores, F, Kocevar, P (1999) Hot electron transport in Ballistic Electron Emission Spectroscopy: Band structure effects and k parallel -space currents. Europhysics Letters (EPL), 45. 181-187 doi:10.1209/epl/i1999-00144-3
Reuter, K, de Andres, P.L, Garcı́a-Vidal, F.J, Flores, F, Heinz, K (2000) Electronic surface structure of CoSi2(111)/Si(111): implications for ballistic electron-emission microscopy currents. Applied Surface Science, 166. 103-107 doi:10.1016/s0169-4332(00)00387-1
de Pablos, P. F., García-Vidal, F. J., Flores, F., de Andres, P. L. (2002) Electronic transport on Au/Si structures: Electron-electron, electron-phonon, and band structure effects. Physical Review B, 66 (7) doi:10.1103/physrevb.66.075411
de Andres, P.L., Reuter, K., Garcia-Vidal, F.J., Flores, F., Hohenester, U., Kocevar, P. (1998) A Theoretical Analysis of Ballistic Electron Emission Microscopy: Band Structure Effects and Attenuation Lengths. Acta Physica Polonica A, 93 (2). 281-287 doi:10.12693/aphyspola.93.281
Garcia-Vidal, F. J., de Andres, P. L., Flores, F. (1996) Elastic Scattering and the Lateral Resolution of Ballistic Electron Emission Microscopy: Focusing Effects on the Au/Si Interface. Physical Review Letters, 76 (5). 807-810 doi:10.1103/physrevlett.76.807
Reuter, K., de Andres, P.L., Garcia-Vidal, F.J., Sestovic, D., Flores, F., Heinz, K. (2000) Green's function calculation of Ballistic Electron Emission Microscopy currents (BEEM v2.1). Computer Physics Communications, 127. 327-342 doi:10.1016/s0010-4655(99)00502-0
de Andres, P.L., Reuter, K., Garcia-Vidal, F.J., Sestovic, D., Flores, F. (1998) A theoretical analysis of ballistic electron emission microscopy: k-space distributions and spectroscopy. Applied Surface Science, 123. 199-206 doi:10.1016/s0169-4332(97)00428-5
Strahberger, C., Smoliner, J., Heer, R., Strasser, G. (2001) Enhancedk‖filtering effects in ballistic electron emission experiments. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205306
 
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