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Shilo, D., Lakin, E., Zolotoyabko, E. (2001) Comprehensive strain analysis in thin films based on high-resolution x-ray diffraction: Application to implantedLiNbO3. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205420

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Reference TypeJournal (article/letter/editorial)
TitleComprehensive strain analysis in thin films based on high-resolution x-ray diffraction: Application to implantedLiNbO3
JournalPhysical Review B
AuthorsShilo, D.Author
Lakin, E.Author
Zolotoyabko, E.Author
Year2001 (May 3)Volume63
Issue20
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.63.205420Search in ResearchGate
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Mindat Ref. ID14156750Long-form Identifiermindat:1:5:14156750:3
GUID0
Full ReferenceShilo, D., Lakin, E., Zolotoyabko, E. (2001) Comprehensive strain analysis in thin films based on high-resolution x-ray diffraction: Application to implantedLiNbO3. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205420
Plain TextShilo, D., Lakin, E., Zolotoyabko, E. (2001) Comprehensive strain analysis in thin films based on high-resolution x-ray diffraction: Application to implantedLiNbO3. Physical Review B, 63 (20) doi:10.1103/physrevb.63.205420
In(2001, May) Physical Review B Vol. 63 (20) American Physical Society (APS)

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Shilo, D., Lakin, E., Zolotoyabko, E. (2001) Measurement of subtle strain modifications in heterostructures by using X-ray mapping in reciprocal space. Journal of Applied Crystallography, 34 (6). 715-721 doi:10.1107/s0021889801013759
Zolotoyabko, E, Shilo, D, Lakin, E (2001) X-ray imaging of acoustic wave interaction with dislocations. Materials Science and Engineering: A, 309. 23-27 doi:10.1016/s0921-5093(00)01686-5
Berkowicz, E., Gershoni, D., Bahir, G., Lakin, E., Shilo, D., Zolotoyabko, E., Abare, A. C., Denbaars, S. P., Coldren, L. A. (2000) Measured and calculated radiative lifetime and optical absorption ofInxGa1−xN/GaNquantum structures. Physical Review B, 61 (16) 10994-11008 doi:10.1103/physrevb.61.10994
Zolotoyabko, E., Shilo, D. (2009) Comment on “Interaction of a surface wave with a dislocation”. Physical Review B, 80 (13) doi:10.1103/physrevb.80.136101
Avrahami, Y, Shilo, D, Mainzer, N, Zolotoyabko, E (1999) Study of atomic diffusion in crystalline structures by high-resolution X-ray diffraction. Journal of Crystal Growth, 198. 264-269 doi:10.1016/s0022-0248(98)00981-6
Levit, M., Zolotoyabko, E., Weiss, B.‐Z. (1996) High‐resolution x‐ray diffraction measurements of residual stresses in polycrystalline thin films deposited on single crystalline substrates. Applied Physics Letters, 69 (27). 4242-4244 doi:10.1063/1.116958
Shilo, D., Zolotoyabko, E. (2003) Stroboscopic X-Ray Imaging of Vibrating Dislocations Excited by 0.58 GHz Phonons. Physical Review Letters, 91 (11). doi:10.1103/physrevlett.91.115506
Shilo, D., Lakin, E., Zolotoyabko, E., Härtwig, J., Baruchel, J. (2003) X-ray imaging of surface acoustic waves generated in semiconductor crystals by an external transducer. Applied Physics Letters, 82 (9). 1374-1376 doi:10.1063/1.1557320
Zamir, S., Steinberg, O., Lakin, E., Zolotoyabko, E. (2006) Simulation of X-ray diffraction profiles in multilayers by direct wave summation: Application to asymmetric reflections. Applied Surface Science, 253. 118-123 doi:10.1016/j.apsusc.2006.05.104
Glorieux, Christ, Zolotoyabko, Emil (2001) Neural network application to the inverse scattering problem in high-resolution X-ray diffraction. Journal of Applied Crystallography, 34 (3). 336-342 doi:10.1107/s0021889801004691
Fatemi, M., Tadayon, B., Twigg, M. E., Dietrich, H. B. (1993) High-resolution x-ray analysis of strain in low-temperature GaAs. Physical Review B, 48 (12) 8911-8917 doi:10.1103/physrevb.48.8911
 
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